Test Method Standard, Microcircuits (w/Change 1) FSC: 5962 This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For thepurpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. Points of Contact: DSCC MIL-STD-883 Group Phone: 614-692-8754, 9467 Email: STD883@dla.mil

Document Downloads

• MIL-STD-883

• MIL-STD-883-1 w/Change 2 

• MIL-STD-883-2 w/Change 1 

• MIL-STD-883-3 w/Change 1 

• MIL-STD-883-4 w/Change 1 

• MIL-STD-883-5 w/Change 1 

• MIL-STD-883-5 w/Change 2 (Initial Draft) 

• Standard Microcircuit Cross-Reference

An on-line reference for standard microcircuits covered by SMDs and MIL-M-38510 specifications.

• Standard Microcircuit Lookup Table

Downloads for cross-referencing standard microcircuits

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